home
EN fr  es 
News

About the OIML
# Introduction and Structures  
# Membership  
# Headquarters (BIML)  
# Developing Countries  
# Organizations in Liaison  
# Memoranda of Understanding (MoU)  
# VIP and Awards Section  
# Becoming an OIML Member  

Publications
# OIML R, D, V, G, B, E, S  
# Translations of OIML Publications  
# Final Drafts  
# Bulletin  
# Conference and CIML Minutes  
# Reference Documents, Brochures  

Technical Structures
# Technical Committees (TC/SC)  
# Committee Drafts  
# TC/SC Web Sites  
# Technical Liaisons  
# Reports and Statistics  
# WTO TBT Notifications  

OIML Systems
# Introduction  
# Mutual Acceptance Arrangement - MAA  
# Registered Certificates  

National Regulations
# Inquiry results: OIML R  

Meetings, Seminars, Events
# OIML Meetings  
# Conference and CIML web sites  
# OIML Seminars  
# Events of Interest  

Restricted Access
# Members' Access  
# Presidential Council  





October 2003 OIML Bulletin

The Acrobat PDF files of the articles published in this edition of the OIML Bulletin may be downloaded from this page.

Use the RIGHT HAND mouse button and select "Save target as" to download the Acrobat PDF file to your hard disk for future use (recommended) or the LEFT HAND mouse button to view it directly online (slow)

 

Complete Bulletin now available: Click here to download



Technique

Selection of standard weights for calibration of weighing instruments
Teuvo Lammi


Evolutions

The metrology system in Chile: Present situation and outlook
Hartmut Apel and Ignacio Lira

Measurement support services
Alfréd Menyhárd


Seminar 2020

Legal metrology tendencies in the Russian Federation
Alexander Astashenkov

Legal metrology in 2020 - Role of governments in Africa’s developing countries
Jackai Derrick Mosima

Perspective for China’s legal metrology
Li Dai


Update

OIML Certificate System: Certificates registered by the BIML, 2003.05 - 2003.07

Reports:

- OIML Workshop Report: MAA - Checklists
- COOMET TC 2 Meeting
- 19th WELMEC Committee Meeting
- 53rd CECIP General Assembly
- International Conference: The role of metrology in the conditions of a globalized market

Notices

New CIML Member; OIML Meetings; Committee Drafts received by the BIML