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OIML VIP Pages
Winners of OIML Awards and Letters of Appreciation

There are three types of recompense:

1- Medals given to recognize the outstanding contribution of individuals to the development of legal metrology.
2- Letters of Appreciation to mark excellent work on a specific project relating to legal metrology.
3- OIML Award for Excellent Achievements in Legal Metrology in Developing Countries.


Medals

 

2012

    

Pu
Changcheng

Philippe
Leclercq

    
 

2011

    

Lev
Issaev

Jacques
Bourgeois

    
 

2010
    
  

Brian
Beard

Heinz
Wallerus

Nicolai
Zhagora

  
 

2009
    
      

Arnold
Leitner

   
 

2008
    
   

Hiroe
Sakai

Peter
Pakay

   
 

2007

Romain
Eggermont
(Award received
by Frans Deleu)

Gérard
Lagauterie

Ali
Tukai

Bruno
Vaucher

 

2006
 

Martin
Birdseye

Manfred
Kochsiek

Attila
Szilvássy

 
 

2005

Ken
Butcher

Li
Chuanqing

Mitsuru
Tanaka

Aart
Kooiman

 

2004
 

John
Anthony

Klaus
Brinkmann

Hajime
Onoda

 
 

2003
 

Knut
Birkeland

Gep
Engler

Jim
Williamson

 
 

2002
   

Dieter
Buer

Detlev
Mencke

   

Letters of Appreciation

Galitsyna Lyubov (2012)
Directorate of Metrology, Indonesia (2012)

Mariela Saavedra (2011)
Morteza Pouyan (2011)

Alexey B. Diatlev (2009)
Wilhelm Kolaczia (2009)
Momyshev Talgat Amangeldievich (2009)
Nand Kishore Singhania (2009)

Peter Brandes (2007)
Charles Ehrlich (2007)
Mikhalchenko Vassily Nikolaevich (2007)

Corinne Lagauterie (2006)

Richard Davis (2005)
Michael Gläser (2005)

S.V. Gupta (2004)
Valentina Vytolskaya (2004)
Wilfried Wünsche (2004)

Wim Klein (2003)
G. Volkmann (2003)


Award for Excellent Achievements

Click here for the Award for Excellent Achievements web page