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Technique |
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Method
for calculating the coverage factor in
calibration |
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Seminar 2020 - Saint-Jean-de-Luz, September 2002 |
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The
face of legal metrology in South Africa and its possible
influence in Africa Progress
and our genius for
compromise Pattern
approval and pattern compliance in an age of globalisation -
The Australian approach |
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Update |
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OIML Certificate System: Certificates registered by the BIML, 2002.05 – 2002.07 Reports: 2003 Events: New Member; OIML Meeting; Committee Drafts received by the BIML |