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October 2002 OIML Bulletin

The Acrobat PDF files of the articles published in this edition of the OIML Bulletin may be downloaded from this page.

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Method for calculating the coverage factor in calibration
Pawel Fotowicz

Seminar 2020 - Saint-Jean-de-Luz, September 2002

The face of legal metrology in South Africa and its possible influence in Africa
supporting the New Program for African Development (NEPAD)

Stuart Carstens

Progress and our genius for compromise
Martin Birdseye

Pattern approval and pattern compliance in an age of globalisation - The Australian approach
Judith Bennett and Adrian Caster


OIML Certificate System: Certificates registered by the BIML, 2002.05 – 2002.07

18th WELMEC Committee Meeting
52nd CECIP General Assembly
The First Middle East Metrology Conference and Exhibition
INMETRO International Meeting on Metrology and Quality
Introduction to Metrology Seminar

2003 Events:
International Metrology Congress, October 2003
Milestones in Metrology, March-April 2003

New Member; OIML Meeting; Committee Drafts received by the BIML